investigations on structural and electrical properties of cadmium zinc sulfide thin films

nowadays, ii – iv group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. cadmium zinc sulfide (zn-cds) thin films were grown by chemical bath deposition (cbd) technique. x-ray diffraction (xrd) is used to analyze the structure and crystallite size and scanning electron microscopy is used to study the morphology of zn-cds thin film. optical studies have been carried out using uv-visible-nir transmission spectrum. the dielectric properties of zn-cds thin films have been studied in the different frequency at different temperatures. the ac conductivity study shows a normal dielectric behavior with frequency which reveals that the dispersion is due to the interfacial polarization.